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Assessing the impact of lighting during Focus Variation scanning on the quality of mapping surfaces produced within the MEX process based on the FFF technology

Metrology & Hallmark

Authors Jolanta Królczyk, Piotr Niesłony, Marta Bogdan-Chudy, Grzegorz Królczyk (Opole University of Technology), Grzegorz Budzik, Łukasz Przeszłowski (Rzeszow University of Technology), Patryk Mietliński, Bartosz Gapiński, Michał Wieczorowski, Tomasz Bartkowiak (Poznan University of Technology), Anna Trych-Wildner, Natalia Wojciechowska (Central Office of Measures)

Abstract

Additive manufacturing of polymer products via the MEX (Material Extrusion) process based on the FFF (Fused
Filament Fabrication) technology is one of the most common 3D printing methods. A layered model structure
significantly affects SGS, which depends on, among others, thickness of layers applied, processed material,
surface inclination relative to the layer application direction and surface type. The objective of the research
was to determine the impact of lighting colour as part of the Focus Variation (FV) scanning technique on the
mapping quality of the surface obtained via the layered extrusion method (MEX). Surface reflexivity was also
taken into account through assessing the impact of surface inclination relative to the microscope optical axis.
A Senosfar neox microscope with a 10x lens was selected for the research. A clear impact of the inclination
angle exhibited by the scanned surfaces and the colour of the light employed for its scanning on the mapping
quality of a digital surface image was observed. A classic sample configuration, where the scanned surface
was generally positioned perpendicular to the microscope optical axis (0° angle) provided very good surface
mapping at a level of almost 100 %. In this case, the light colour did not matter much. Increasing the scanned
surface inclination angle (15°, 30°) has an adverse impact on the quality of its digital mapping. This area recorded
most non-measured points, regardless of the surface inclination, when scanning with red light, and the
best mapping was provided when working with blue light. It can be assumed that light with a wavelength significantly distant from the surface colour range should be used to scan a surface in a given colour.
Significant differences in the following mean amplitude, height, and mixed surface parameters were observed:
Sa, Sq, Sp and Sv, as well as Ssk and Sku, both in relation to the impact of surface inclination towards the microscope optical axis, and to the effect of applying digital fill of non-measured points.

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additive manufacturing, FFF, Focus Variation, metrology, MEX

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