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Procedure for data preparation for the correct evaluation of the geometrical structure of the surface in functional analysis
619
17.12.2024
Karol Grochalski, Szymon Wojciechowski, Dominika Podbereska, Michał Wieczorowski - Poznan University of Technology; Piotr Niesłony, Grzegorz Królczyk, Jolanta Królczyk, Marta Bogdan-Chudy, Roman Chudy - Opole University of Technology; Katarzyna Nicińska, Łukasz Ślusarski - Central Office of Measures
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Assessment of selected parameters of the geometric structure of the surface based on mechanical and electromagnetic mapping
751
11.12.2024
Piotr Niesłony, Grzegorz Królczyk, Jalanta Królczyk, Marta Bogdan-Chudy, Roman Chudy (The Opole University of Technology), Karol Grochalski, Szymon Wojciechowski, Dominika Podbereska, Michał Wieczorowski (Poznan University of Technology) Katarzyna Nicińska, Łukasz Ślusarski (Central Office of Measures)
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Digital Twin in Metrology: Opportunities, Current Implementations and Research Challenges
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Review of surface metrology artifacts for polymer-based additive manufacturing
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Linearity measurement of digitizers used in sampling-based digital impedance bridges by the method of permuting capacitors
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Machine Learning-Based Selection of Measurement Technique for Surface Metrology: A pilot study