Tag Campus of Central Office of Measures
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Calibration patterns and procedures for scanning probe microscopes: the path to the nanoworld
The project "Production and characterization of nanostructures for the calibration of scanning probe microscopes" is an innovative initiative aimed at developing precise calibration procedures for atomic force microscopes (AFM) and scanning tunnelling microscopes (STM).
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Delegation from Latvia at the Central Office of Measures
On 5 and 6 November 2024, a delegation from Latvia visited the Central Office of Measures
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The grand opening of the Świętokrzyski Laboratory Campus of the Central Office of Measures