Special World Metrology Day 2020
Let's celebrate World Metrology Day 2020 in a responsible way, following national and social principles of safe behavior, helping to find global solutions in the fight against pandemics. The theme for World Metrology Day 2020 is Measurements for global trade.
Accurately 100 years - 1st of April 2019
Congratulations from representatives of state authorities and foreign guests, the highest presidential orders, artistic performances and even layer cake. All these special things has happen while Central Office of Measures celebrated its 100th anniversary. The ceremony took place in the Hall under the Dome at the Ministry of Enterprise and Technology.
Metrology with science, economy and industry - the 100th anniversary of GUM
On 1st April 2019, the jubilee conference of the Central Office of Measures will be held at the headquarters of the Ministry of Enterprise and Technology.
GA EURAMET was held online
On May 25-26 The 14th EURAMET General Assembly was held with the participation of the President of GUM. Due to the prevailing epidemic, the meeting was held online.
Central Office of Measures co-founder of WELMEC e.V.!
On November 21st, 2019, the Central Office of Measures (GUM) became one of the founding countries of WELMEC e.V. - a new metrology organization originally based on WELMEC (European Cooperation in Legal Metrology).
Participation of the GUM delegation in the 54th meeting of the International Committee of Legal Metrology in Bratislava
On October 21-25 this year 54th meeting of the International Committee of Legal Metrology (CIML) was held in Bratislava with the participation of the Polish delegation.
Dr. Eng. Jerzy Borzymiński from the Central Office of Measures awarded the prestigious medal of the International Organization of Legal Metrology
On October 24th, 2019, during the 54th meeting of the International Committee of Legal Metrology (CIML), Dr. Jerzy Borzymiński received from the CIML President prof. dr. Roman Schwartz Medal of the International Organization of Legal Metrology (OIML)